State-of-the-art flash memory devices and post-flash emerging memories
نویسندگان
چکیده
منابع مشابه
Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifetime of the memory array, as opposed to time-zero or technological issues, and the viewpoint is focused on the understanding of the root causes. ...
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ژورنال
عنوان ژورنال: Science China Information Sciences
سال: 2011
ISSN: 1674-733X,1869-1919
DOI: 10.1007/s11432-011-4221-z